Personnel Information

写真a

Nakane Hideaki


The master's program in charge

Division of Information and Electronic Engineering

The doctoral program in charge

Division of Engineering

The department in charge

Department of Information and Electronic Engineering

Job title

Professor

E-mail Address

E-mail address

Research field 【 display / non-display

  • Electron device/Electronic equipment

  • Electronic materials/Electric materials

Keywords for Research Field 【 display / non-display

  • sensing

  • Field emitter, Superconducting device

Graduate school・Graduate course, etc. 【 display / non-display

  • Hokkaido University

    1981.03,Doctoral program,Graduate School, Division of Engineering,Division of Electrical Enginnering,Completed,Japan

Graduate school・major, etc. 【 display / non-display

  • Hokkaido University

    1976.03,Faculty of Engineering,Department of Electoronic Enginnering,Graduate,Japan

Academic Society 【 display / non-display

  • The Japan Society of Applied Physics

  • The Institute of Electronics, Information and Communication Engineering

 

高感度磁気センサを用いた非破壊計測法

操業したままで管の肉厚を測定する

Purpose of Research

磁気センサで非破壊・非接触の測定法,技術の開発

発電所,化学プラントなどで,運転を止めないでパイプの肉厚や反応容器等の板厚の計測をしたいときには非破壊・非接触の測定法が求められる。高感度の磁気センサを用いることにより,検査対象物に対し,非接触での測定が可能になる。非接触による厚さ測定の技術を用い,高感度化によるノイズの増加に対応するための技術を確立させる。

Summary of Research

周波数特性の違いから管の板厚を計測

高感度のフラックスゲート型磁気センサを用いて,対象物の運転を止めることなく,かつ非破壊・非接触でパイプなどの厚さを計測する。高感度のセンサのためノイズが増加するが,低周波域の磁界の計測を利用することにより,交流域の磁界信号も高感度で計測可能となった。目的信号の10倍以上の強度を示すノイズを含む信号の中から目的の信号のみを取り出し,厚さを高精度で計測可能にした。渦電流磁界の周波数特性の違いから管の板厚を計測する手法により,50mm離れたところからの計測も可能で,±数%の高精度で計測することができる。

Research Content

Features / Benefits of Research

1.Point of research 2.Research of novelty
  • 非破壊・非接触かつ断熱材などの介在物を通しても測定可能
  • 非破壊・非接触かつ媒介物を通しても測定可能
3.Primacy of Technology 4.Situation of patent-related
  • 高感度磁気センサにより断熱材などの介在物に厚みがあっても測定可能
 

Books 【 display / non-display

  • Practical measurement, evaluation and control, application of work function and ionization potential.

    吉武道子、石井久夫、佐々木正洋、中根英章、,情報機構,酸化物修飾した金属表面の計測 ZrO/W(100),Yoxide/W(100),Hfoxide/W(100),(p.353),2010.09

  • Sensor materials

    コロナ社,電気磁気センサ,(p.128),2000.06

  • 薄膜電子デバイス年鑑

    プレスジャーナル,ジョセフソン素子,(p.628),1991.03

Papers 【 display / non-display

  • Non destructive inspection by using fluxgate magnetic sensor

    中根英章,Journal of the Japanese society for non-destructive inspection,vol.36,(11),(p.575 ~ 577),2014.11

  • Fe substitution effect on filled skutterudite superconductor LaRu4P12

    T.KAWAAI, Y.KAWAMURA, J.HAYASHI, M.MATSUDA, H.NAKANE, H.GOTOU, C.SEKINE,Journal of the Physical Society of Japan,2013.12

  • Work function of W(100) field emitter modified with lutetium oxide and measured with photoemission electron microscope.

    H.Nakane, Y.Nakano, T.Kawakubo,Journal of Vacuum Science and Technology,vol.B27,(2),(p.719 ~ 720),2009.04

  • Studies W(100) modified by praseodymium oxide by using x-ray photoelectron spectroscopy, low-energy electron diffraction, and photoelectron emission microscopy.

    T.Kawakubo,Y.Nakano, H.Nakane,Journal of Vacuum Science and Technology,vol.B27,(2),(p.698 ~ 700),2009.04

  • X-ray photoelectron spectroscpy and low-energy electron difraction analyses on the extremely low work-function surface of W(100) modified by yttrium oxide.

    T.Kawakubo, H.Nakane,Journal of Vacuum Science and Technology,vol.B26,(4),(p.1395 ~ 1397),2008.04

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International conference proceedings 【 display / non-display

  • Work Function Measurement of Hf-oxide/W(100) Surface by using of Photoemission Electron Microscope

    H.Nakane, T.Kawakubo,Technical Digest of the 29th International Vacuum Nanoelectronics Conference,vol.2016,(p.169 ~ 170),Institute of Electrical and Electronics Engineers Inc.,2016.07,Vancouver

  • Field Emission Characteristics from Molybdenum (100) Surface with Thin Yttrium Oxide Layer

    T.Kawakubo, T.Kitani, H.Nakane,Proceedings of the 22nd International Display Workshop,(p.402 ~ 404),The Society for Information Display,2015.12,Otsu

  • Work Function Measurement of Er-oxide/W(100) Surface by using of Photoemission Electron Microscope

    H.Nakane, T.Kawakubo,Technical Digest of the 28th International Vacuum Nanoelectronics Conference,(p.110 ~ 111),Institute of Electrical and Electronics Engineers Inc.,2015.07,Guangzhou

  • Work function measurements of Tungsten Surface Modified by Praseodymium Oxide by Using Field Emission Microscopy and Retarding Method.

    T.Kawakubo, K.Kanbara, T.Kitani, H.Nakane,Proceedings of 21st International Display Workshops.,vol.2014,(p.602 ~ 604),The Institute of Image Information and Television Engineers,2014.12,Niigata

  • Work Function Measurement of Ce-oxide/W(100) Surface by busing of Photoemission Electron Microscope

    H.Nakane, T.Kawakubo,Technical Digestof 27th International Vacuum Nanoelectronics Conference,vol.2014,(p.244 ~ 245),Institute of Electrical and Electronics Engineers Inc.,2014.07,Engelberg

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Editorial and Commentary 【 display / non-display

  • Field emission electron andits applications

    中根,IEEJ Transaction on sensor, micromachin,vol.124,(6),(p.207 ~ ),2004.06

  • Sccaning probe microscope, today and future

    中根,IEEJ Transaction,vol.116-A,(4),(p.293 ~ 296),1996

Research reports 【 display / non-display

  • Work function measurement of Y-oxide/W(100) surface by using PEEM and FEM

    中根英章、川久保貴史,第14回真空ナノエレクトロニクスシンポジウム予稿集,vol.14,(p.239 ~ 242),2017.03

  • Work function measurement W(100) surface modified with Nd-oxide by using of PEEM and FEM

    中根英章、川久保貴史,第12回真空ナノエレクトロニクスシンポジウム予稿集,vol.12,(p.51 ~ 61),2015.03

  • Work function measurement of Sm-oxide/W(100) surface and Yb-oxide/W(100) surface by using PEEM and FEM

    中根英章、伊藤寛晃、川久保貴志,第11回真空ナノエレクトロニクスシンポジウム予稿集,vol.11,(p.87 ~ 96),2014.03

  • W field emission cathode covered with rare earth oxide mono-layer and transition metal oxide-layer, PEEM analysis and FEM analysis.

    中根英章、武田紘己、川久保貴志,電子情報通信学会技術研究報告,vol.vol.113,(No.257),(p.19 ~ 22),2013.10

  • Work function measurement of Er-oxide/W(100) and Sc-oxide/W(100) surface by using PEEM and FEM

    中根英章、武田紘己、川久保貴史,第10回真空ナノエレクトロニクスシンポジウウム予稿集,vol.10,(p.87 ~ 96),2013.03

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Presentaion at conference, meeting, etc. 【 display / non-display

  • Noise reduction in eddy current NDE with high sensitive magnetic senser

    山田悠貴、中根英章,第52回応用物理学会北海道支部学術講演会,応用物理学会,第52回応用物理学会北海道支部学術講演会講演予稿集,(p.82),2017.01.08,北見,日本

  • Work function of W(100) surface of W emitter modefied by Y-oxide

    祖根立樹、中根英章,第52回応用物理学会北海道支部学術講演会,応用物理学会,第52回応用物理学会北海道支部学術講演会講演予稿集,(p.44),2017.01.07,北見,日本

  • Work Function Measurement of Y-oxide/W(100) Surface by using of Photoemission Electron Microscope

    三好雄稀、中根英章,第52回応用物理学会北海道支部学術講演会,応用物理学会,第52回応用物理学会北海道支部学術講演会講演予稿集,(p.43),2017.01.07,北見,日本

  • Work function measurement of Hf-oxide/W(100) surface by using Photoemission Electron Microscope

    H.Nakane, T.Kwakubo,29th International Vacuum Nanoelectronics Conference,Institute of Electrical and Electronics Engineers Inc.,Thechnical Digest of the 29th International Vacuum Nanoelectronics Conference,(p.169-170),2016.07.13,Vancouver,Canada

  • Work function measurement of Ce-oxide/W(100) surface by using Photoemission Electron Microscope

    H.Nakane, T.Kwakubo,27th International Vacuum Nanoelectronics Conference,Institute of Electrical and Electronics Engineers Inc.,Thechnical Digest of the 27th International Vacuum Nanoelectronics Conference,(p.63-64),2014.07.07,Engelberg,Switzerland

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Class subject in charge 【 display / non-display

  • 電磁気学II

    2017,Department

  • 工学演習II

    2017,Department

  • 電磁気学I

    2017,Department

  • 量子工学特論

    2017,Master's program

  • 学内インターンシップ(電子デバイス計測コース)

    2017,Master's program

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